Title of article :
Guest Editorʹs Introduction: Microprocessor Testing Today
Author/Authors :
Wayne Needham، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
2
From page :
56
To page :
57
Journal title :
IEEE Design and Test of Computers
Serial Year :
1998
Journal title :
IEEE Design and Test of Computers
Record number :
431197
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431197
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