Title of article
Testability Features of the AMD-K6 Microprocessor
Author/Authors
R. Scott Fetherston Imtiaz P. Shaik Siyad C. Ma ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
6
From page
64
To page
69
Abstract
The AMD-K6ʹs embedded design-for-testability structures and test pattern development methodologies provide high-quality manufacturing tests. The DFT features support static voltage-level testing for wafer-sort and debug testing, application of two pattern sequences for detection of timing-related failures, scan-based BIST, and 1149.1 boundary scan
Journal title
IEEE Design and Test of Computers
Serial Year
1998
Journal title
IEEE Design and Test of Computers
Record number
431199
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