Title of article :
Alpha 21164 Manufacturing Test Development and Coverage Analysis
Author/Authors :
Carol J. Stolicny، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
7
From page :
98
To page :
104
Abstract :
To meet the challenge of creating test vectors for the Alpha 21164 microprocessor, Compaqʹs engineers describe a test generation and grading scheme that solves time-to-market, quality and cost concerns
Journal title :
IEEE Design and Test of Computers
Serial Year :
1998
Journal title :
IEEE Design and Test of Computers
Record number :
431204
Link To Document :
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