Title of article :
Online BIST for Embedded Systems
Author/Authors :
Hussain Al-Asaad
Brian T. Murray
John P. Hayes
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Abstract :
Embedded systems must meet increasingly high expectations of safety and high reliability. The authors survey online-testing techniques for identifying faults that can lead to system failure. They focus on online built-in self-test and its role in a comprehensive testing approach
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers