مرکز منطقه ای اطلاع رساني علوم و فناوري - Deep Submicron CMOS Current IC Testing: Is There a Future?

Title of article :

Deep Submicron CMOS Current IC Testing: Is There a Future?

Author/Authors :

Charles F. Hawkins Jerry M. Soden ، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1999

Pages :

From page :

To page :

Journal title :

IEEE Design and Test of Computers

Serial Year :

1999

Journal title :

IEEE Design and Test of Computers

Record number :

431251

Link To Document :