Title of article
Test and Reliability: Partners in IC Manufacturing, Part 2
Author/Authors
Charles F. Hawkins، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
8
From page
66
To page
73
Abstract
This article discusses the major gate oxide failure modes, reliability modeling, burn-in, and qualification testing. We present a typical method to calculate failure rates
Journal title
IEEE Design and Test of Computers
Serial Year
1999
Journal title
IEEE Design and Test of Computers
Record number
431258
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