• Title of article

    Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling

  • Author/Authors

    Pramodchandran N. Variyam Abhijit Chatterjee ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    10
  • From page
    106
  • To page
    115
  • Abstract
    For complex mixed-signal designs, BIST is becoming a necessity. The BIST scheme presented here maximizes coverage of parametric and catastrophic failures and provides an all-digital BIST solution to analog circuits
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2000
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431299

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431299