• Title of article

    Test Development for a Third-Version ColdFire Microprocessor

  • Author/Authors

    Alfred L. Crouch، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    9
  • From page
    29
  • To page
    37
  • Abstract
    The design-for-test methodology of the MCF5307 device is described, illustrating issues faced, how solutions were derived, and results
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2000
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431306