Title of article
Test Development for a Third-Version ColdFire Microprocessor
Author/Authors
Alfred L. Crouch، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
9
From page
29
To page
37
Abstract
The design-for-test methodology of the MCF5307 device is described, illustrating issues faced, how solutions were derived, and results
Journal title
IEEE Design and Test of Computers
Serial Year
2000
Journal title
IEEE Design and Test of Computers
Record number
431306
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