Title of article
Effectiveness of Microarchitecture Test Program Generation
Author/Authors
Noppanunt Utamaphethai ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
12
From page
38
To page
49
Abstract
Investigation of a list of design errors typically encountered in industry is undertaken to determine if our microarchitecture test programs can detect them. Two metrics, functional and timing deviation are used to determine design error coverage
Journal title
IEEE Design and Test of Computers
Serial Year
2000
Journal title
IEEE Design and Test of Computers
Record number
431307
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