Title of article :
Guest Editorsʹ Introduction: Defect-Oriented Diagnosis for Very Deep-Submicron Systems
Author/Authors :
Fabrizio Lombardi
Cecilia Metra
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
