مرکز منطقه ای اطلاع رساني علوم و فناوري - Survey of Low-Power Testing of VLSI Circuits

Title of article :

Survey of Low-Power Testing of VLSI Circuits

Author/Authors :

Patrick Girard، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2002

Pages :

From page :

To page :

Journal title :

IEEE Design and Test of Computers

Serial Year :

2002

Journal title :

IEEE Design and Test of Computers

Record number :

431391

Link To Document :