Title of article :
Efficient and Economical Test Equipment Setup Using Procorrelation
Author/Authors :
Bin-Hong Lin، نويسنده , , Intellectual Property Library Co.
Cheng-Wen Wu، نويسنده , , National Tsing Hua University
Hwei-Tsu Ann Luh، نويسنده , , Taiwan Semiconductor Manufacturing Co.
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
The procorrelation system (PCS) obtains a high-quality correlation between die failures on a premanufactured recorded correlation wafer and the test equipment setup for the current wafer lot. PCS greatly reduces analysis time and test cost, compared with conventional full-wafer probing and offers significant benefits for deep-submicron ICs.
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
