Title of article
Efficient and Economical Test Equipment Setup Using Procorrelation
Author/Authors
Bin-Hong Lin، نويسنده , , Intellectual Property Library Co. Cheng-Wen Wu، نويسنده , , National Tsing Hua University Hwei-Tsu Ann Luh، نويسنده , , Taiwan Semiconductor Manufacturing Co. ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
10
From page
34
To page
43
Abstract
The procorrelation system (PCS) obtains a high-quality correlation between die failures on a premanufactured recorded correlation wafer and the test equipment setup for the current wafer lot. PCS greatly reduces analysis time and test cost, compared with conventional full-wafer probing and offers significant benefits for deep-submicron ICs.
Journal title
IEEE Design and Test of Computers
Serial Year
2004
Journal title
IEEE Design and Test of Computers
Record number
431467
Link To Document