Title of article
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure
Author/Authors
Samvel Shoukourian، نويسنده , , Virage Logic Valery Vardanian، نويسنده , , Virage Logic Yervant Zorian، نويسنده , , Virage Logic ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
8
From page
200
To page
207
Abstract
Today, embedded memories are the most important contributor to SoC yield. To maximize embedded-memory yield, advanced test and repair solutions must be an integral part of the memory block. We analyze factors that affect memory yield and presents advanced techniques for maximizing the positive impact.
Journal title
IEEE Design and Test of Computers
Serial Year
2004
Journal title
IEEE Design and Test of Computers
Record number
431496
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