Title of article :
Enhanced Equivalence Checking: Toward a Solidarity of Functional Verification and Manufacturing Test Generation
Author/Authors :
Jayanta Bhadra، نويسنده , , Freescale Semiconductor Narayanan Krishnamurthy، نويسنده , , Freescale Semiconductor Magdy S. Abadir، نويسنده , , Freescale Semiconductor ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
9
From page :
494
To page :
502
Abstract :
This article, from the Motorola (now Freescale) PowerPC design group, presents an interesting synergy among test, equivalence verification, and constraints. The authors use RTL, gate, and switch models of a design in two different flows one for test and one for functional verification to show that rectifying constraints and merging tests between the-two flows saves significant presilicon debug effort.
Journal title :
IEEE Design and Test of Computers
Serial Year :
2004
Journal title :
IEEE Design and Test of Computers
Record number :
431535
Link To Document :
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