Title of article
BIST the hard way
Author/Authors
Scott Davidson، نويسنده , , Sun Microsystems، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
2
From page
386
To page
387
Abstract
Reviewed in this issue A Designerʹs Guide to Built-in Self-Test, by Charles E. Stroud (Springer, 2002, ISBN 1-402-07050-0, 344 pp., $125).
Journal title
IEEE Design and Test of Computers
Serial Year
2005
Journal title
IEEE Design and Test of Computers
Record number
431598
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