Title of article :
BIST the hard way
Author/Authors :
Scott Davidson، نويسنده , , Sun Microsystems، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Abstract :
Reviewed in this issue A Designerʹs Guide to Built-in Self-Test, by Charles E. Stroud (Springer, 2002, ISBN 1-402-07050-0, 344 pp., $125).
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
