Title of article :
Design and test on chip for EMC
Author/Authors :
Fabian Vargas، نويسنده , , PUCRS، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
2
From page :
502
To page :
503
Abstract :
The "Design and test on chip for EMC" panel at the 2006 EMC Europe International Symposium on Electromechanical Compatibility addressed the recent explosion of the portable-electronics market and the increasingly hostile electromagnetic environment in which these systems must operate.
Journal title :
IEEE Design and Test of Computers
Serial Year :
2006
Journal title :
IEEE Design and Test of Computers
Record number :
431701
Link To Document :
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