Title of article :
Tackling variability and reliability challenges
Author/Authors :
Shekhar Borkar، نويسنده , , Intel، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
1
From page :
520
To page :
520
Abstract :
Variability and reliability will be the barriers to future technology scaling. Every discipline, from fabrication to software, needs to cooperate and make the VLSI system reliable in the presence of variability and the resulting inherent unreliability of components.
Journal title :
IEEE Design and Test of Computers
Serial Year :
2006
Journal title :
IEEE Design and Test of Computers
Record number :
431703
Link To Document :
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