Title of article
Computer-Aided Design and Test for Digital Microfluidics
Author/Authors
Fei Su، نويسنده , , Intel Jun Zeng، نويسنده , , Coventor ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
11
From page
60
To page
70
Abstract
This article discusses several aspects of design and test methodology centered on digital microfluidics, including modeling, simulation, synthesis, test, and reconfiguration. The automated design methods for digital electronics and adaption of them to droplet-based microfluidics are explained. The test methodology detects both catastrophic and parametric faults by electrically controlling and tracking the motion of the test stimuli droplets and also facilitates concurrent testing, in which fault testing and biomedical assays run simultaneously on a microfluidic system.
Journal title
IEEE Design and Test of Computers
Serial Year
2007
Journal title
IEEE Design and Test of Computers
Record number
431711
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