Title of article :
ITC 2006 panels
Author/Authors :
Carol Stolicny، نويسنده , , Intel، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
3
From page :
94
To page :
96
Abstract :
The International Test Conference technical program has long included panel sessions that provide an informal, entertaining opportunity for ITC audiences to engage in discussion and debates with industry and research experts on a wide range of subjects. This tradition continued in a new venue in 2006 with an intriguing slate of panel sessions. In this column, the ITC 2006 panel organizers capture the deliberations and results from their respective panels for D&T readers who may not have had the opportunity to attend the conference or perhaps attended different, parallel panel discussions.
Journal title :
IEEE Design and Test of Computers
Serial Year :
2007
Journal title :
IEEE Design and Test of Computers
Record number :
431714
Link To Document :
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