Author/Authors :
Jing Wang، نويسنده , , Texas A&M University
Duncan M. (Hank) Walker، نويسنده , , Texas A&M University
Xiang Lu، نويسنده , , P.A. Semi
Ananta Majhi، نويسنده , , NXP Semiconductors
Bram Kruseman، نويسنده , , NXP Semiconductors
Guido Gronthoud، نويسنده , , NXP Semiconductors
Luis Elvira Villagra، نويسنده , , NXP Semiconductors
Paul J.A.M. van de Wiel، نويسنده , , NXP Semiconductors
Stefan Eichenberger، نويسنده , , NXP Semiconductors
، نويسنده ,
Abstract :
Excessive power supply noise during test can cause overkill. This article discusses two models for supply noise in delay testing and their application to test compaction. The proposed noise models avoid complicated power network analysis, making them much faster than existing power noise analysis tools. can cause performance degradation and
