Author/Authors :
Santiago Remersaro، نويسنده , , University of Iowa
Xijiang Lin، نويسنده , , Mentor Graphics
Sudhakar M. Reddy، نويسنده , , University of Iowa
Irith Pomeranz، نويسنده , , Purdue University
Janusz Rajski، نويسنده , , Mentor Graphics
، نويسنده ,
Abstract :
Supply current and power dissipation during scan-based test can be far higher than during normal circuit operation because of increased switching activity caused by the tests. In this paper, we propose a method that fills unspecified entries in test cubes to reduce the switching activity caused by scan tests simultaneously during the scan-shift and capture cycles. Our method doesnʹt require additional hardware or modifications to the scan chains.
