Title of article :
Leakage Minimization Technique for Nanoscale CMOS VLSI
Author/Authors :
Kyung Ki Kim، نويسنده , , Northeastern University Yong-Bin Kim، نويسنده , , Northeastern University Minsu Choi، نويسنده , , University of Missouri-Rolla Nohpill Park، نويسنده , , Oklahoma State University، نويسنده , , Stillwater ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
9
From page :
322
To page :
330
Abstract :
Because of the continued scaling of technology and supply-threshold voltage, leakage power has become more significant in power dissipation of nanoscale CMOS circuits. Therefore, estimating the total leakage power is critical to designing low-power digital circuits. In nanometer CMOS circuits, the main leakage components are the subthreshold, gate-tunneling, and reverse-biased junction band-to-band-tunneling (BTBT) leakage currents.
Journal title :
IEEE Design and Test of Computers
Serial Year :
2007
Journal title :
IEEE Design and Test of Computers
Record number :
431753
Link To Document :
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