Title of article :
DATE 07 workshop on diagnostic services in NoCs
Author/Authors :
Krishnendu Chakrabarty
Erik Jan Marinissen
، نويسنده , , NXP Research
Axel Jantsch، نويسنده , , KTH Stockholm
Nicola Nicolici، نويسنده , , McMaster University
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Abstract :
The Workshop on Diagnostic Services in Network-on-Chips, held during DATE 2007, focused on test, debugging, and online monitoring in NoCs. The main body of the workshop was formed by two sessions with full-length paper presentations and two lively poster sessions with a total of 28 posters. EPFLʹs Giovanni De Micheli gave the keynote address, and the workshop also featured a panel session led by Tensilicaʹs Grant Martin and invited talks by Virage Logicʹs Yervant Zorian and NXP Semiconductorsʹ Kees Goossens. The workshop produced electronic online proceedings, including papers, slides, and posters-totaling 420 pages.
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers