Author/Authors :
Joe Kelly، نويسنده , , Verigy
Dean Nicholson، نويسنده , , Agilent Technologies
Edwin Lowery، نويسنده , , Verigy
Victor Grothen، نويسنده , , Agilent Technologies
، نويسنده ,
Abstract :
RFIC testing requires cost-effective and innovative hardware implementation. The authors of this article have dramatically improved the speed of RF switches on high-performance ATE by shining a bright light on the switches. This solution provides practical, cost-effective RF testing.
