Title of article
Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers
Author/Authors
Ganesh Srinivasan، نويسنده , , Texas Instruments Friedrich Taenzler، نويسنده , , Texas Instruments Abhijit Chatterjee، نويسنده , , Georgia Institute of Technology ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
10
From page
150
To page
159
Abstract
This article discusses a loopback DFT test approach for RFIC chips that provides quick, economical test results at the wafer level. By performing RF testing before chip packaging, the authors reduce test cost. They show that test yield on the ATE for Texas Instrumentsʹ RFIC devices is high when this loopback DFT approach is used.
Journal title
IEEE Design and Test of Computers
Serial Year
2008
Journal title
IEEE Design and Test of Computers
Record number
431817
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