Title of article
Wireless System for Microwave Test Signal Generation
Author/Authors
Qizhang Yin، نويسنده , , Monolithic Power Systems William R. Eisenstadt، نويسنده , , University of Florida Tian Xia، نويسنده , , Spansion ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
7
From page
160
To page
166
Abstract
RF testing involves distribution of an RF source to chips. This article describes an RF embedded-testing technique that distributes RF sources to the unpackaged RF chip via an antenna. The authors demonstrate this technique on a 5-GHz low-noise amplifier, thus eliminating expensive RF probes and test fixtures.
Journal title
IEEE Design and Test of Computers
Serial Year
2008
Journal title
IEEE Design and Test of Computers
Record number
431818
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