• Title of article

    Imaging of CH4 decomposition around the Ni/YSZ interfaces under anodic polarization

  • Author/Authors

    Teruhisa Horita، نويسنده , , Katsuhiko Yamaji، نويسنده , , Tohru Kato، نويسنده , , Haruo Kishimoto، نويسنده , , Yueping Xiong، نويسنده , , Natsuko Sakai، نويسنده , , Manuel E. Brito، نويسنده , , Harumi Yokokawa، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    6
  • From page
    133
  • To page
    138
  • Abstract
    The catalytic activities of Ni-mesh/YSZ samples for CH4 decomposition and reaction with reformed gases were compared under voltage-applied condition (fuel cell operation condition) by imaging analysis of labeled gases with secondary ion mass spectrometry (SIMS). The effect of applied voltages was compared in the mixture of CH4, D2O, and 18O2 to label the movements of hydrogen and oxygen. A significant carbon deposition was observed at the Ni-mesh under zero-voltage condition. However, the applied voltage formed a thin oxide layer on the Ni surface and eliminated the deposited carbon on the Ni surface. Oxygen spill-over around the Ni/YSZ interfaces could effectively eliminate the deposited carbon. A possible reaction mechanism was considered for the optimum metal–oxide interfaces of SOFCs.
  • Keywords
    Secondary ion mass spectrometry (SIMS) , SOFC , imaging , Ni/YSZ interface , Isotope labeling
  • Journal title
    Journal of Power Sources
  • Serial Year
    2005
  • Journal title
    Journal of Power Sources
  • Record number

    445532