Title of article
Boundary element analysis of cracked film–substrate media
Author/Authors
Yen-Ling Chung، نويسنده , , Chin-Foung Pon، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
16
From page
75
To page
90
Abstract
This study evaluates the stress behavior of a cracked ®lm±substrate medium by applying the multi-region boundary
element method. Four problems addressed herein are the crack tip within a ®lm, the crack tip terminating at the interface,
interface debonding, and the crack penetrating into the substrate. The multi-region boundary element method is
initially developed and, then, the stress intensity factors or the energy release rates are evaluated according to the
dierent stress singularities of the four considered problems. These results indicate that the stress intensity factors or the
energy release rates of the four problems rely not only on the dierent elastic mismatches and crack lengths, but also on
the thickness ratio of the ®lm and the substrate
Keywords
Cracked ®lm±substrate medium , Stress intensity factor , Multi-region boundary element method , Energy release rate
Journal title
International Journal of Solids and Structures
Serial Year
2000
Journal title
International Journal of Solids and Structures
Record number
447199
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