Title of article :
Interfacial Electronic Structure of Thin Cu Films Grown on Ar^+-ion Sputter-cleaned alpha-Al2O3 Substrates
Author/Authors :
Gao، Min نويسنده , , Scheu، Christina. نويسنده , , Ruhie، Manfred نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
-116
From page :
117
To page :
0
Abstract :
For the fractional Brownian motion (fBm) the problem of extrapolation from a segment, the canonical representation of fBm via white noise on a segment and their reciprocal relation, and Girsanovʹs formula are considered. A general approach to these problems is based on the invariance of fBm with respect to linear rational transformations of time. This approach practically excludes the solution of integral equations and explains the efficiency of the aforementioned problems for~fBm.
Keywords :
Ion sputtering , alpha-Al2O3 , Electronic structure , Cu film
Journal title :
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
Serial Year :
2002
Journal title :
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
Record number :
44890
Link To Document :
بازگشت