Title of article :
Post collision interaction in the L3-M4,5M4,5 Auger spectra in solid state copper
Author/Authors :
Thurgate، S.M. نويسنده , , Coward، D.M. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
-192
From page :
193
To page :
0
Abstract :
High resolution photoelectron spectroscopy has shown the presence of disorder broadening of the Cu 2p3/2 photoelectron line in CuPt alloys. The broadening is greatest for the Cu50Pt50 composition as predicted by the charge correlated model. The broadening is less in Cu75Pt25 than in Cu25Pt75 probably due to the tendency to order in Cu75Pt25.
Keywords :
Copper Auger spectra , Threshold spectra , Post collision interaction
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year :
2000
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number :
48285
Link To Document :
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