Author/Authors :
Ziethen، C. نويسنده , , Schmidt، O. نويسنده , , Marx، G.K.L. نويسنده , , Sch?nhense، G. نويسنده , , Fr?mter، R. نويسنده , , Gilles، J. نويسنده , , Kirschner، J. نويسنده , , Schneider، C.M. نويسنده , , Gr?ning، O. نويسنده ,
Abstract :
High resolution photoelectron spectroscopy has shown the presence of disorder broadening of the Cu 2p3/2 photoelectron line in CuPt alloys. The broadening is greatest for the Cu50Pt50 composition as predicted by the charge correlated model. The broadening is less in Cu75Pt25 than in Cu25Pt75 probably due to the tendency to order in Cu75Pt25.
Keywords :
X-PEEM , µ-XANES , Amorphous carbon , Diamond , Graphite , Spectromicroscopy , Orbital mapping
