Title of article
Work function measurements on indium tin oxide films
Author/Authors
Schlaf، R. نويسنده , , Murata، H. نويسنده , , Kafafi، Z. H. نويسنده ,
Pages
-148
From page
149
To page
0
Abstract
We determined the work function of indium tin oxide (ITO) films on glass substrates using photoemission spectroscopy (PES). The ITO coated glass substrates were chemically cleaned ex-situ, oxygen plasma treated ex-situ, or sputtered in-situ. Our results suggest that the performance of ultraviolet photoemission spectroscopy (UPS) measurements can induce a significant work function reduction on the order of 0.4-0.5 eV, on ex-situ chemically and oxygen-plasma treated ITO samples. This was demonstrated by the use of low intensity X-ray photoemission spectroscopy (XPS) work function measurements before and after the UPS measurements were carried out.
Keywords
fractal analysis , Particle morphology , Ultrafine , fine and coarse particle concentrators
Journal title
Astroparticle Physics
Record number
48399
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