Title of article :
Elastic electron reflection for determination of the inelastic mean free path of medium energy electrons in 24 elemental solids for energies between 50 and 3400 TeV
Author/Authors :
Richter، Gerald J. نويسنده , , Werner، Wolfgang S.M. نويسنده , , Tomastik، Christian نويسنده , , Cabela، Thomas نويسنده , , St?ri، Herbert نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
-126
From page :
127
To page :
0
Abstract :
The charge transfer core-hole screening depends on the ratio between the charge transfer rate and the rate of change in separation-energies between the acceptor and donor levels in a charge transfer system. The latter is related to how fast a photoelectron leaves the system. As examples we discussed the core-level XPS spectra of the N2 molecule physisorbed on graphite and the L23 XPS spectra of the formally pure divalent Cu compounds such as CuO and YBa2 Cu3 O7-delta. The interplay between the adiabatic transition and the non-adiabatic transition upon a core-electron ionization (excitation) in a charge transfer system is discussed in the light of the relaxation and core-hole decay.
Keywords :
electron transport , scattering , Elastic , inelastic , microscopy , Spectroscopy , Electron-solid interactions , Electron reflection
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year :
2001
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number :
48411
Link To Document :
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