X-ray diffraction studies of as-cast high-palladium alloys

Objectives. The purpose of this study was to use x-ray diffraction (XRD) to investigate four representative high-palladium alloys in the as-cast condition and obtain new information about the metallurgical phases. Methods. Two Pd---Cu---Ga alloys and two Pd---Ga alloys were cast into plate-shaped specimens (20 mm × 20 mm × 1.5 mm) which were bench-cooled. Polished and etched specimens were analyzed using two different x-ray diffractometers and CuKa radiation. Results. All four alloys exhibited strong XRD peaks for the face-centered cubic (fcc) palladium solid solution matrix, and variations in the lattice parameter were consistent with alloy compositions. Comparison of the relative peak intensities for the alloys and the pure palladium powder standard indicated that the as-cast microstructures had preferred crystallographic orientation. Because the two Pd---Cu---Ga alloys contained appreciable amounts of near-surface lamellar interdendritic or eutectic constituents, it was possible to determine previously unreported XRD peaks for the Pd2Ga phase in these alloys. Low-intensity peaks in the Pd---Ga alloys were attributed to small amounts of secondary phases observed in the microstructures. Significance. Knowledge of the metallurgical structures of these high-palladium alloys can be important for interpretation of microstructural observations, mechanical properties, corrosion behavior and clinical performance.