Title of article :
Raman Microspectroscopy: A Comparison of Point, Line, and Wide-Field Imaging Methodologies
Author/Authors :
Schlucker، Sebastian نويسنده , , Schaeberle، Michael D. نويسنده , , Huffman، Scott W. نويسنده , , Levin، Ira W. نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2003
Pages :
-4311
From page :
4312
To page :
0
Abstract :
Three different Raman microspectroscopic imaging methodologies using a single experimental configuration are compared; namely, point and line mapping, as representatives of serial imaging approaches, and direct or wide-field Raman imaging employing liquid-crystalline tunable filters are surveyed. Raman imaging data acquired with equivalent low-power 514.5-nm laser excitation and a cooled CCD camera are analyzed with respect to acquisition times, image quality, spatial resolution, intensity profiles along spatial coordinates, and spectral signal-to-noise ratios (SNRs). Point and line mapping techniques provide similar SNRs and reconstructed Raman images at spatial resolutions of ~1.1 (mu)m. In contrast, higher spatial resolution is obtained by direct, global imaging (~313 nm), allowing subtle morphological features on test samples to be resolved.
Keywords :
Crop yields , Hedges , Shelterbelts , Field margins , Yield gains
Journal title :
Analytical Chemistry
Serial Year :
2003
Journal title :
Analytical Chemistry
Record number :
51359
Link To Document :
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