• Title of article

    Raman Microspectroscopy: A Comparison of Point, Line, and Wide-Field Imaging Methodologies

  • Author/Authors

    Schlucker، Sebastian نويسنده , , Schaeberle، Michael D. نويسنده , , Huffman، Scott W. نويسنده , , Levin، Ira W. نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2003
  • Pages
    -4311
  • From page
    4312
  • To page
    0
  • Abstract
    Three different Raman microspectroscopic imaging methodologies using a single experimental configuration are compared; namely, point and line mapping, as representatives of serial imaging approaches, and direct or wide-field Raman imaging employing liquid-crystalline tunable filters are surveyed. Raman imaging data acquired with equivalent low-power 514.5-nm laser excitation and a cooled CCD camera are analyzed with respect to acquisition times, image quality, spatial resolution, intensity profiles along spatial coordinates, and spectral signal-to-noise ratios (SNRs). Point and line mapping techniques provide similar SNRs and reconstructed Raman images at spatial resolutions of ~1.1 (mu)m. In contrast, higher spatial resolution is obtained by direct, global imaging (~313 nm), allowing subtle morphological features on test samples to be resolved.
  • Keywords
    Crop yields , Hedges , Shelterbelts , Field margins , Yield gains
  • Journal title
    Analytical Chemistry
  • Serial Year
    2003
  • Journal title
    Analytical Chemistry
  • Record number

    51359