Emission probabilities of KX- and γ-rays following 166Hom decay

Emission probabilities of KX- and γ-rays following the decay of the long-lived isomer 166Hom were precisely measured with two calibrated germanium detectors. Using these data, 166Hom can be employed to obtain accurate efficiency values for semiconductor detectors in the 50–1000 keV energy range. The principal instrumentation characteristics, details of the experimental procedure and the obtained results are given.