Title of article
Evaluated cross section and thick target yield data bases of Zn+p processes for practical applications
Author/Authors
Ferenc Szelecsényi، نويسنده , , Thomas E. Boothe، نويسنده , , S?ndor Tak?cs، نويسنده , , Ferenc T?rk?nyi، نويسنده , , Emanuel Tavano، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
28
From page
1005
To page
1032
Abstract
On the basis of the present experimental work and available literature results, we have evaluated the cross section/integral thick target physical yield data for image(p, x)image, image(p, x)image, image(p, n)image, image(p, 2n)image, image(p, 3n)image, image(p, xn)image, image(p, n)image, image(p, 2n)image, image(p, xn)image, image(p, n)image and image(p, xn)image nuclear reactions up to 30 MeV. The data sets were evaluated via curve fitting to supply recommended values for practical applications such as routine radioisotope production, nuclear wear/corrosion measurements and nuclear analytical applications.
Journal title
Applied Radiation and Isotopes
Serial Year
1998
Journal title
Applied Radiation and Isotopes
Record number
540160
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