Title of article :
Application of X-ray fluorescence for the analysis of some technological materials
Author/Authors :
N.M. Mukhamedshina، نويسنده , , A.A. Mirsagatova، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
8
From page :
715
To page :
722
Abstract :
Various X-ray fluorescence techniques have been developed for the determination of the composition of two- and three-component alloys. It has been found experimentally and confirmed theoretically that in some alloys, the composition can be determined without taking into account the absorption and secondary excitation of analytical characteristic lines, indicating that the contributions of these effects are opposite. X-ray techniques have also been applied to determine the composition of various kinds of technological waste. As a rule, waste contains many so-called “light” elements (Z<19) for which characteristic lines cannot be detected. In these cases, an independent measurement of the quantity of one of these elements is necessary to determine the quantities of the others. In most of the cases, instrumental neutron activation analysis is used for the independent measurement.
Keywords :
X-ray fluorescence (XRF) technique , Si(Li) detector , Standardless fundamental parameter mode , Alloy waste
Journal title :
Applied Radiation and Isotopes
Serial Year :
2005
Journal title :
Applied Radiation and Isotopes
Record number :
542163
Link To Document :
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