Measurement of 241Am L X-ray emission probabilities

Measurements of 241Am L X-ray emission probabilities were conducted using both HPGe and Si(Li) detectors. The efficiency calibrations of these detectors were performed by means of a tunable, monochromatic photon beam and the determination of the thickness of absorbing materials inside the detector. These efficiency calibrations were obtained without any reference to radionuclide decay data, and with 0.8% relative standard uncertainty. The complex L X-ray region was processed using Voigt functions and by taking account of the detector response function established with the monochromatic beam. Twenty-two components of the L X-ray group were identified and quantified. The present results are compared with previously published data.