Title of article :
Single crystal refinements of TbTiGe, GdTiGe and TbTi0.85Mo0.15Ge with CeFeSi- and CeScSi-type structures
Author/Authors :
Malaman، B. نويسنده , , Welter، R. نويسنده , , Morozkin، A. V. نويسنده , , Klosek، V. نويسنده , , Vernière، A. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
-206
From page :
207
To page :
0
Abstract :
The atomic coordinates of the TbTi0.85Mo0.15Ge, GdTiGe and TbTiGe compounds have been refined from single crystal X-ray diffraction measurements. Both former compounds have a tetragonal CeScSi-type structure (I4/mmm, ordered variant of the La2Sb-type) while TbTiGe crystallizes in the CeFeSi-type (P4/nmm). The structural properties and the relative stability of both CeFeSi and CeScSi-type structures along the whole RTiGe series (R=La-Nd, Sm, Gd-Tm, Lu) are discussed and compared to those of others isotypic RTX compounds.
Keywords :
Al–Ho–Ti alloys , Isothermal section , X-ray diffraction , Phase diagram
Journal title :
JOURNAL OF ALLOYS AND COMPOUNDS
Serial Year :
2000
Journal title :
JOURNAL OF ALLOYS AND COMPOUNDS
Record number :
58858
Link To Document :
بازگشت