Title of article
Trace element analysis by means of synchrotron radiation, XRF, and PIXE: selection of sample preparation procedure
Author/Authors
W.M.، Kwiatek, نويسنده , , M.، Galka, نويسنده , , C.، Paluszkiewicz, نويسنده , , B.، Kubica, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
-282
From page
283
To page
0
Abstract
Lattice parameter and thermal-expansion coefficient for magnesium nitride, Mg3N2, were determined using X-ray powder diffraction at the B2 beamline in Hasylab (DESY) in the temperature range from 11 K up to 304.5 K. The relative change of lattice parameter on raising the temperature in the studied range is about 0.14%. At 300 K, its value is 9.9644(1) ? and the linear thermal expansion coefficient derived from a polynomial approximation is a=1.1×10?5 K?1.
Keywords
Trace elements , sample preparation , synchrotron radiation , XRF , PIXE
Journal title
JOURNAL OF ALLOYS AND COMPOUNDS
Serial Year
2001
Journal title
JOURNAL OF ALLOYS AND COMPOUNDS
Record number
59228
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