• Title of article

    Trace element analysis by means of synchrotron radiation, XRF, and PIXE: selection of sample preparation procedure

  • Author/Authors

    W.M.، Kwiatek, نويسنده , , M.، Galka, نويسنده , , C.، Paluszkiewicz, نويسنده , , B.، Kubica, نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    -282
  • From page
    283
  • To page
    0
  • Abstract
    Lattice parameter and thermal-expansion coefficient for magnesium nitride, Mg3N2, were determined using X-ray powder diffraction at the B2 beamline in Hasylab (DESY) in the temperature range from 11 K up to 304.5 K. The relative change of lattice parameter on raising the temperature in the studied range is about 0.14%. At 300 K, its value is 9.9644(1) ? and the linear thermal expansion coefficient derived from a polynomial approximation is a=1.1×10?5 K?1.
  • Keywords
    Trace elements , sample preparation , synchrotron radiation , XRF , PIXE
  • Journal title
    JOURNAL OF ALLOYS AND COMPOUNDS
  • Serial Year
    2001
  • Journal title
    JOURNAL OF ALLOYS AND COMPOUNDS
  • Record number

    59228