Title of article
Surface and Near Surface Analysis by Ion Beam Techniques
Author/Authors
Baghizadeh، Ali نويسنده , , Agha Aligol، Davoud نويسنده , , Talebi-Taher، Alireza نويسنده , , Lamehi-Rachti، Mohammad نويسنده , , Moradi، Mahmood نويسنده ,
Issue Information
فصلنامه با شماره پیاپی 0 سال 2007
Pages
5
From page
36
To page
40
Abstract
The specific aspects of Ion Beam Analysis (IBA) for near surface and thin film characterization are discussed.
The application of IBA techniques in material science, surface physics, thin film deposition and crystal growth
has been investigated. In this paper, we report some new obtained results in Van De Graaff Laboratory on the
different samples after installation of Channeling and Micro-Beam systems. The aim of this paper is description
of the IBA techniques capabilities in material analysis.
Journal title
Journal of Theoretical and Applied Physics
Serial Year
2007
Journal title
Journal of Theoretical and Applied Physics
Record number
691128
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