Title of article
Leaching tests with thin film solar cells based on copper indium diselenide (CIS)
Author/Authors
Ronald A. Finke، نويسنده , , A. Kriele، نويسنده , , W. Thumm، نويسنده , , D. Bieniek، نويسنده , , A. Kettrup، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
9
From page
1633
To page
1641
Abstract
Photovoltaic modules based on copper indium diselenide as photoactive layer were investigated with respect to potential threats to the environment by breaking either by accident or in a landfill. Different Leaching tests. the American Toxicity Characteristics Leaching Procedure (TCLP), the German DEV S4 test, the Swiss Leach Test and two tests with synthetic percolating waters were applied. The type of module investigated shows rather low leaching rates for most of the elements present. With only one exception it would stand different national regulatory levels valid at present which are related to these leaching tests.
Keywords
Elution , Leaching test , TCLP. DEY S4 , Solar Cell. Copper Indium Diselenide
Journal title
Chemosphere
Serial Year
1996
Journal title
Chemosphere
Record number
722696
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