• Title of article

    Leaching tests with thin film solar cells based on copper indium diselenide (CIS)

  • Author/Authors

    Ronald A. Finke، نويسنده , , A. Kriele، نويسنده , , W. Thumm، نويسنده , , D. Bieniek، نويسنده , , A. Kettrup، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1996
  • Pages
    9
  • From page
    1633
  • To page
    1641
  • Abstract
    Photovoltaic modules based on copper indium diselenide as photoactive layer were investigated with respect to potential threats to the environment by breaking either by accident or in a landfill. Different Leaching tests. the American Toxicity Characteristics Leaching Procedure (TCLP), the German DEV S4 test, the Swiss Leach Test and two tests with synthetic percolating waters were applied. The type of module investigated shows rather low leaching rates for most of the elements present. With only one exception it would stand different national regulatory levels valid at present which are related to these leaching tests.
  • Keywords
    Elution , Leaching test , TCLP. DEY S4 , Solar Cell. Copper Indium Diselenide
  • Journal title
    Chemosphere
  • Serial Year
    1996
  • Journal title
    Chemosphere
  • Record number

    722696