• Title of article

    Aging and thermal stability of Mg/SiC and Mg/Y2O3 reflection multilayers in the 25-35 nm region

  • Author/Authors

    Yamazaki، Atsushi نويسنده , , Ejima، Takeo نويسنده , , Banse، Takanori نويسنده , , Saito، Katsuhiko نويسنده , , Kondo، Yuji نويسنده , , Ichimaru، Satoshi نويسنده , , Takenaka، Hisataka نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    -5445
  • From page
    5446
  • To page
    0
  • Abstract
    Reflection measurements in the 25-35 nm region were made for Mg/SiC and Mg/Y2O3 multilayers kept in a low-humidity atmosphere for 4 or 5 years. Aged Mg/SiC multilayers keep their reflectances, and the reflectance value at 31.2 nm is 0.44 at 10(degree) of the normal angle of incidence. Aged Mg/Y2O3 multilayers change reflectance as top layer materials, and the best value at 30.1 nm is 0.40 at 10(degree). Reflection measurements are also made for Mg-based multilayers that are annealed from room temperature to 400 (degree)C at 50 (degree)C intervals. Both multilayers keep their reflectance at annealing temperatures of 200 (degree)C. These results suggest that both Mg-based multilayers can be applied to practical optics.
  • Keywords
    Thin films , Optical properties , X-ray optics , X-ray mirrors
  • Journal title
    Applied Optics
  • Serial Year
    2005
  • Journal title
    Applied Optics
  • Record number

    74650