Title of article :
Discrepancies between roughness measurements obtained with phase-shifting and white-light interferometry
Author/Authors :
Rhee، Hyug-Gyo نويسنده , , Vorburger، Theodore V. نويسنده , , Lee، Jonathan W. نويسنده , , Fu، Joseph نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Abstract :
Discrepancies between phase-shifting and white-light interferometry have been observed in stepheight and surface roughness measurements. The discrepancies have a strong relation to the roughness average parameter of the surface. The skewing effect, which mainly occurs in the vicinity of peaks, valleys, and edges of the sample, causes this problem in white-light interferometry of step height. For roughness, two possible sources of the discrepancy are considered.
Keywords :
instrumentation , Metrology , Measurement , Height measurements , Surface measurements , Interferometry , figure , microscopy , Interference microscopy , Roughness
Journal title :
Applied Optics
Journal title :
Applied Optics