Title of article
Plasma interferometry and how the bound-electron contribution can bend fringes in unexpected ways
Author/Authors
Nilsen، Joseph نويسنده , , Johnson، Walter R. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
-7294
From page
7295
To page
0
Abstract
Utilizing a new average atom code, we calculate the index of refraction in C, Al, Ti, and Pd plasmas and show many conditions over which the bound-electron contribution dominates the free electrons as we explore photon energies from the optical to 100 eV (12 nm) soft x rays. For decades measurement of the electron density in plasmas by interferometers has relied on the approximation that the index of refraction in a plasma is due solely to the free electrons and therefore is less than 1. Recent measurements of Al plasmas using x-ray laser interferometers observed fringes bending in the opposite direction than expected due to the boundelectron contribution causing the index of refraction to be larger than 1. During the next decade x-ray free-electron lasers and other sources will be available to probe a wider variety of plasmas at higher densities and shorter wavelengths, so understanding the index of refraction in plasmas is essential.
Keywords
COHERENCE , Speckle , statistical optics , instrumentation , Measurement , Surface measurements , scattering , rough surfaces , Ultrafast optics , Ultrafast phenomena , Metrology , Roughness
Journal title
Applied Optics
Serial Year
2005
Journal title
Applied Optics
Record number
74980
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