• Title of article

    Plasma interferometry and how the bound-electron contribution can bend fringes in unexpected ways

  • Author/Authors

    Nilsen، Joseph نويسنده , , Johnson، Walter R. نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    -7294
  • From page
    7295
  • To page
    0
  • Abstract
    Utilizing a new average atom code, we calculate the index of refraction in C, Al, Ti, and Pd plasmas and show many conditions over which the bound-electron contribution dominates the free electrons as we explore photon energies from the optical to 100 eV (12 nm) soft x rays. For decades measurement of the electron density in plasmas by interferometers has relied on the approximation that the index of refraction in a plasma is due solely to the free electrons and therefore is less than 1. Recent measurements of Al plasmas using x-ray laser interferometers observed fringes bending in the opposite direction than expected due to the boundelectron contribution causing the index of refraction to be larger than 1. During the next decade x-ray free-electron lasers and other sources will be available to probe a wider variety of plasmas at higher densities and shorter wavelengths, so understanding the index of refraction in plasmas is essential.
  • Keywords
    COHERENCE , Speckle , statistical optics , instrumentation , Measurement , Surface measurements , scattering , rough surfaces , Ultrafast optics , Ultrafast phenomena , Metrology , Roughness
  • Journal title
    Applied Optics
  • Serial Year
    2005
  • Journal title
    Applied Optics
  • Record number

    74980