Title of article
Multiple-scattering effects on static light-scattering optical structure factor measurements
Author/Authors
Sorensen، Christopher M. نويسنده , , Chakrabarti، Amit نويسنده , , Mokhtari، Tahereh نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
-7857
From page
7858
To page
0
Abstract
We show that the extent and effect of multiple scattering on angularly resolved light-scattering intensity measurements, the optical structure factor, can be quantitatively described by a single parameter, the average number of scattering events along the scattering volume. This quantity is easily measured or calculated and hence provides a useful experimental indicator of multiple scattering, which is a hindrance to accurate structure factor measurements.
Keywords
X-ray lasers , XUV , Integrated optics , laser optics , Lasers , Integrated optics devices , UV , frequency conversion , Multiharmonic generation , nonlinear optics
Journal title
Applied Optics
Serial Year
2005
Journal title
Applied Optics
Record number
75175
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