Title of article
Diffraction-induced coherence levels
Author/Authors
Tiziani، Hans J. نويسنده , , Osten، Wolfgang نويسنده , , Tavrov، Alexander نويسنده , , Schmit، Joanna نويسنده , , Kerwien، Norbert نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
-2201
From page
2202
To page
0
Abstract
We examined the influence of complex diffraction effects on low-coherence fringes created for high-aspect depth-to-width ratio structures called trenches. The coherence function was analyzed for these micrometer-wide trenches and was registered with a white-light interference microscope. For some types of surface structure we observed that additional low-coherence fringes that do not correspond directly to the surface topology are formed near the sharp edges of the structures. These additional coherence fringes were studied by rigorous numerical evaluations of vector diffractions, and these simulated interference fields were then compared with experimental results that were obtained with a white-light interference microscope.
Keywords
Coherent optical effects , statistical optics , COHERENCE , instrumentation , Partial coherence in imaging , Measurement , Metrology , Fringe analysis , Interferometry , microscopy , Interference microscopy , Imaging systems
Journal title
Applied Optics
Serial Year
2005
Journal title
Applied Optics
Record number
75706
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