• Title of article

    Irradiation Stability of Silicon Photodiodes for Extreme-Ultraviolet Radiation

  • Author/Authors

    Scholze، Frank نويسنده , , Klein، Roman نويسنده , , Bock، Thomas نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    -5620
  • From page
    5621
  • To page
    0
  • Abstract
    Photodiodes are used as easy-to-operate detectors in the extreme-ultraviolet spectral range. At the Physikalisch-Technische Bundesanstalt photodiodes are calibrated with an uncertainty of spectral responsivity of 0.3% or less. Stable photodiodes are a prerequisite for the dissemination of these high-accuracy calibrations to customers. Silicon photodiodes with different top layers were exposed to intense extreme-ultraviolet irradiation. Diodes coated with diamondlike carbon or TiSiN proved to be stable within a few percent up to a radiant exposure of 100 kJ /cm^2 . The changes in responsivity could be explained as being due to carbon contamination and to changes in the internal charge collection efficiency. In ultrahigh vacuum, no indication of oxidation was found.
  • Keywords
    Ocean optics , Remote sensing
  • Journal title
    Applied Optics
  • Serial Year
    2003
  • Journal title
    Applied Optics
  • Record number

    76447