Title of article :
Measurement of Profiles along a Circle on Two Flat Surfaces by Use of a Fizeau Interferometer with No Standard
Author/Authors :
Iwata، Koichi نويسنده , , Sonozaki، Shohachi نويسنده , , Iwahashi، Yoshihisa نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-6852
From page :
6853
To page :
0
Abstract :
A method for measuring profiles along a circle on a flat surface with no standard is described. For the measurement, two unknown surfaces are placed almost parallel, and the distance between them is measured many times along a circle by rotation of one of the surfaces. Profiles of the two surfaces can be determined from the distance data. In this study the measuring method is explained: The space between two surfaces measured with a Fizeau interferometer. Four measuring experiments are carried out for determining the profile of a precision-grade half-mirror; in each experiment a different ordinary mirror with unknown profile is used as the second mirror. Profiles of the precise mirrors obtained by these experiments agree closely, with deviations of ~2 nm. A similar experiment with many concentric circles was carried out with a precise half-mirror and another precise mirror. Although the profiles of many concentric circles were independent of one another, the result shows that the high-frequency component of a whole plane can be estimated.
Keywords :
instrumentation , Measurement , Surface measurements , figure , Interferometry , Metrology
Journal title :
Applied Optics
Serial Year :
2003
Journal title :
Applied Optics
Record number :
76569
Link To Document :
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